Instrucciones de preparación de la serie TES-5 dedicada a la prueba de chips
The TES-5 series for chip testing is used for electronic component testing. How to accurately detect the chip is very important. So, how much do you know about the test preparation for the TES-5 series for chip testing?
Before starting the TES-5 series test process for chip testing, you should fully understand the working principle of the chip. Be familiar with its internal circuits, the main parameters, the role of each pin and its normal voltage. The preparation work is done well, and the subsequent inspections will be much smoother. The chip is very sensitive, so be careful not to cause a short circuit between the pins during the test. Any short circuit can be caught, which will cause the chip to burn out.
In addition, if the TES-5 series for chip testing does not have an isolation transformer, it is strictly forbidden to use the grounded test equipment to touch the equipment that is powered by the chassis, because it is easy to cause a short circuit of the power supply, thus spreading a wide range and causing the fault to expand. When soldering, make sure that the soldering iron is not charged, the soldering time is short, and no soldering is required. This is to prevent the solder from sticking and causing a short circuit. However, it is also necessary to determine the solder joint and do not allow the phenomenon of solder joints. In some cases, it is found that multiple voltages change. At this time, it is not easy to conclude that the chip has been broken. To know that some faults can also cause the voltage of each pin to be tested as normal, it is not easy to think that the chip is good.
The working environment of the chip requires good heat dissipation. Without a heat sink and high power operation, the chip can only be scrapped. The chip is actually very flexible. When there is partial damage inside, you can add small peripheral components to replace the damaged part. Pay attention to the rationality of the wiring when adding, to prevent parasitic coupling.
The TES-5 series dedicated to chip testing is a chip detection system introduced by LNEYA. Different chip models need to be clear about the relevant TES-5 series for chip testing during testing.
(This article source network, if there is infringement, please contact delete, thank you.)
Recomendaciones relacionadas
-
¿A qué se debe el consumo energético de las unidades de refrigeración de gran tamaño?
1886Durante el funcionamiento de las unidades de refrigeración de gran tamaño, la capacidad de refrigeración y las condiciones de trabajo son los principales problemas de consumo de energía, pero para evitar algunos consumos innecesarios de energía, tenemos que entender claramente. Cuando la ...
Ver detalles -
Constant temperature circulation device can help chip to complete reliability test
1935As the country vigorously develops domestic chips, chip manufacturing is entering the fast lane. After the chip is manufactured, there is a very critical link, which is the reliability test, and the constant temperature circulation device can quic...
Ver detalles -
Description of working principle of high and low temperature impact test chamber
2097Spot high and low temperature impact test chamber, also known as three-box high and low temperature impact test chamber, high and low temperature impact test chamber is mainly composed of low temperature storage chamber, high temperature storage c...
Ver detalles -
¿Cuáles son las funciones de los controladores de los equipos de atemperado de semiconductores?
1487En los equipos de control de temperatura de componentes semiconductores, cada accesorio tiene una función diferente. Debido a las diferentes funciones, la función de la válvula de control de temperatura y el controlador de los componentes semiconductores de LNEYA es dif...
Ver detalles
工業冷水機製造商 LNEYA Taiwan











